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Title of Paper:Experimental Demonstration of High-order In-memory Computing based on IGZO Charge Trapping RAM Array for Polynomial Regression Acceleration

Journal:2022 International Electron Devices Meeting (IEDM)

Place of Publication:San Francisco

Indexed by:Article

Discipline:Engineering

First-Level Discipline:Electronic Science and technology *

Page Number:2.3.1-2.3.4

Translation or Not:no

Included Journals:EI