Gao H*, Cui L, Chen J. Reliability modeling for sparsely connected homogeneous multi-state consecutive k-out-of-n: G systems

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Journal:IEEE Transactions on Systems, Man and Cybernetics: Systems

Indexed by:Journal paper

Discipline:Engineering

Document Type:J

Volume:51

Issue:3

Page Number:1844-1854

Translation or Not:no

Date of Publication:2021-09-01

Included Journals:SCI