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RFID标签天线对RFID系统性能和可靠性影响

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Affiliation of Participant(s):电子工程学院

Leading Scientist:李秀萍

Status:结题

Classification of Project:151

Date of Project Approval:2005-01-01

Date of Project Completion:2008-10-30

Date of Project Initiation:2005-08-01

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