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Yilin Zhou*, Ying Li, Yirun Zhao, Wenrui Lu, Electrochemical Migration of Immersion Silver Plated Printed Circuit Boards Contaminated by Dust Solution, IEEE Transactions on Device and Materials Reliability, March 2021, 21(1): 117-128.
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Pre One:Xueli Jia, Xiaohui Liu, YilinZhou*,Performance Degradation and Life Prediction of Proton Exchange Membrane Fuel Cell,2022 Prognostics and Health Management Conference,London, United Kingdom, May 27-29, 2022,Best Paper Award.
Next One:Yilin Zhou*, Yirun Zhao, Lu Yang, Ying Li, Wenrui Lu, Data-driven Life Modeling of Electrochemical Migration on Printed Circuit Boards under Soluble Salt Contamination, IEEE Access, 2020, 8:182580-182590.