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周怡琳
- 电子邮箱：3544a601ea165c1c0c1d1805846cde31657010ff20cae8ca48be5fcce37d677886860a7038e4164c1b6f68111b003a3409bb9a69073e29dfcf5ce70a7b1de31507cc1e41f198aa56dba670c44e523f3cb8733efbf9a86742ace8052fe32d88c3fd3dc1485779127b6badd2e83fffb09e91598fd1fa48b4c0e1a972a41f12bc8f
- 所在单位：智能工程与自动化学院
- 学历：研究生毕业
- 办公地点：校本部（西土城校区）创新楼106室
- 性别：女
- 联系方式：ylzhou@bupt.edu.cn
- 学位：博士学位
- 职称：教授
- 在职信息：在职
- 毕业院校：北京邮电大学
- 博士生导师
- 硕士生导师
- 学科：电子信息. 控制科学与工程
- 所属院系：智能工程与自动化学院
访问量：
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[11]Yilin Zhou*, Ying Li, Yirun Zhao, Wenrui Lu, Electrochemical Migration of Immersion Silver Plated Printed Circuit Boards Contaminated by Dust Solution, IEEE Transactions on Device and Materials Reliability, March 2021, 21(1): 117-128.
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[12]Yilin Zhou*, Yirun Zhao, Lu Yang, Ying Li, Wenrui Lu, Data-driven Life Modeling of Electrochemical Migration on Printed Circuit Boards under Soluble Salt Contamination, IEEE Access, 2020, 8:182580-182590.
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[13]Yilin Zhou*, Ying Li, Yanyu Chen, Insulation Failure Mechanism of Immersion Silver Finished Printed Circuit Board under NaCl Solution, Journal of Electronic Materials, 2020, 49(3): 2066-2075.
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[14]周怡琳，杨 璐，鲁文睿,尘土颗粒影响下电路板电化学迁移失效寿命建模探索, 2020, 43(3): 11-18，31。
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[15]Yilin Zhou*, Ying Li, Yanyu Chen, Meng Zhu, Life Model of the Electrochemical Migration Failure of Printed Circuit Boards under NaCl Solution, IEEE Transactions on Device Materials Reliability, 2019, 19(4): 622-629.
